Optical-beam profiling by bias-controlled metal-semiconductor-metal structures
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Date
2549-07-29
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APAC-SILICIDE 2006
Abstract
Recently we have shown experimentally that a planar metalsemiconductor-
metal(MSM) structure having a wide
separation between the two metal electrodes exhibits not
only the function of a basic optical sensor but also optical
sensitivity field-controllable by the bias applied [I]. In this
study, we present the experimental results of onedimensional
(ID) optical-beam profiling properties of an
MSM structure as its application. To our knowledge, no
study has appeared on such an application of planar MSM
structures.
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Asia-Pacific Conference on Semiconducting Silicides : Science and Technology