Optical-beam profiling by bias-controlled metal-semiconductor-metal structures
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Date
2549-06-22
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APAC-SILICIDE 2006
Abstract
Recently we have shown experimentally that a planar metalsemiconductor- metal(MSM) structure having a wide separation between the two metal electrodes exhibits not only the function of a basic optical sensor but also optical sensitivity field-controllable by the bias applied [I]. In this study, we present the experimental results of onedimensional (ID) optical-beam profiling properties of an MSM structure as its application. To our knowledge, no study has appeared on such an application of planar MSM structures.
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Keywords
Optical-beam
Citation
Asia-Pacific Conference on Semiconducting Silicides : Science and Technology